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XRD

X-ray Diffraction (XRD) is a powerful technique used to characterize crystalline materials. It provides detailed information on structures, phases, preferred crystal orientations (texture), and other structural parameters such as average grain size, crystallinity, strain, and crystal defects.


XRD has a wide range of applications, including:

  • Identifying phases in bulk and thin-film samples,
  • Detecting crystalline minority phases,
  • Determining crystallite size in polycrystalline films and materials,
  • Measuring the percentage of material in crystalline form versus amorphous form,
  • Analyzing loose powder or dried solution samples for phase identification,
  • Evaluating films for texture and phase behavior,
  • Determining strain and composition in epitaxial thin films,
  • Measuring surface offcut in single-crystal materials, and
  • Assessing residual stress in bulk metals and ceramics.